Download PDF by John G. Webster (Editor) : 13.Computer-Aided Design of Integrated Circuits

By John G. Webster (Editor)

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1990, pp. 52–57. 5. S. J. Friedman and K. J. Spowit, Finding the optimal variable ordering for binary decision diagrams, Proc. 24th ACM/IEEE Des. Autom. , 1987, pp. 348–356. 6. M. Fujita, H. Fujisawa, and N. Kawato, Evaluation and implementation of boolean comparison method based on binary decision diagrams, Proc. IEEE Int. Conf. -Aided Des. (ICCAD ’88), 1988, pp. 6–9. 7. N. Ishiura, H. Sawada, and S. Yajima, Minimization of binary decision diagrams based on exchanges of variables, Proc. IEEE Int.

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Autom. , 1987, pp. 69–76. DESIGN VERIFICATION AND FAULT DIAGNOSIS IN MANUFACTURING 38. E. M. Rudnick, W. K. Fuchs, and J. H. Patel, Diagnostic fault simulation of sequential circuits, Proc. Int. , 1992, pp. 178–186. 39. S. , Rapid diagnostic fault simulation at stuck-at faults in sequential circuits using compact lists, Proc. 32nd ACM/IEEE Des. Autom. , 1995, pp. 133–138. 40. S. Venkataraman, I. Hartanto, and W. K. Fuchs, Dynamic diagnosis of sequential circuits based on stuck-at faults, Proc. , 1996, pp.

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13.Computer-Aided Design of Integrated Circuits by John G. Webster (Editor)

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