By Gordon Roberts, Friedrich Taenzler, Mark Burns
Built-in circuits incorporating either electronic and analog features became more and more frequent within the semiconductor undefined. Mixed-signal IC try out and dimension has grown right into a hugely really expert box of electric engineering. even though, attempt engineering remains to be a comparatively unknown career in comparison to IC layout engineering.
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Extra info for An Introduction to Mixed-Signal Test and Measurement
The customer does not need Chapter 2 . The Test ~pecification Process 25 to split the divider into two halvesandmay not evenneedto know that it can be placedin this testmodeat all. Therefore,testmodesmayor may not be documented in the datasheet. TLC7524C,TLC7524E,TLC75241 8-BIT MULTIPLYING DIGITAL-TO-ANALOG CONVERTERS i SLAS061B-SEPTEMBER 1986- REVISED NOVEMBER 1991 : . Easily Interfaced \ . On-ChIp Data Latches : . Monotonic Over the Entire AID Conversion OUT1 1 16 . Range Segmented High-Order Bits Ensure OUT2 GND 2 3 15 REF 14 ~ DB7 4 to Microprocessors D OR N PACKAGE (TOP VIEW) .
Overview of Mixed-Signal Testing 13 is to providea temporary(socketed)electricalconnectionbetweenthe DUT and the electrical instruments in the tester. The DIB alsoprovidesspacefor DUT-specificlocal circuits suchas loadcircuitsandbuffer amplifiersthat areoftenrequiredfor mixed-signaldevicetesting. 2 Wafer Probers Wafer probers are robotic machines that manipulate wafers as the individual dies are tested by the ATE equipment. The prober moves the wafer underneath a set of tiny electrical probes attachedto a probe card.
Overview of Mixed-Signal Testing 9 correctly in the end-equipment application. The systems engineers are responsible for defining anddocumentingthe customer's requirements so that the rest of the engineering team can design the product and successfully releaseit to production. After the systems engineers have defined the product's technical requirements, design engineersdevelop the corresponding integrated circuit. Hopefully, the new design meets the technical requirements of the customer's application.
An Introduction to Mixed-Signal Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns